Please use this identifier to cite or link to this item:
https://hdl.handle.net/11000/30460
Noise-Scaled Euclidean Distance: A Metric for
Maximum Likelihood Estimation of the PV
Model Parameters
Title: Noise-Scaled Euclidean Distance: A Metric for
Maximum Likelihood Estimation of the PV
Model Parameters |
Authors: Batzelis, Efstratios  Blanes, Jose M.  Toledo Melero, Fco. Javier  Galiano, Vicente  |
Editor: IEEE Xplore |
Department: Departamentos de la UMH::Ingeniería de Computadores |
Issue Date: 2022-05 |
URI: https://hdl.handle.net/11000/30460 |
Abstract:
This article revisits the objective function (or metric)
used in the extraction of photovoltaic (PV) model parameters. A
theoretical investigation shows that the widely used current distance (CD) metric does not yield the maximum likelihood estimates
(MLE) of the model parameters when there is noise in both voltage
and current samples. It demonstrates that the Euclidean distance
(ED) should be used instead, when the voltage and current noise
powers are equal. For the general case, a new noise-scaled Euclidean distance (NSED) metric is proposed as a weighted variation
of ED, which is shown to fetch the MLE of the parameters at any
noise conditions. This metric requires the noise ratio (i.e., ratio
of the two noise variances) as an additional input, which can be
estimated by a new noise estimation (NE) method introduced in
this study. One application of the new metric is to employ NSED
regression as a follow-up step to existing parameter extraction
methods toward fine-tuning of their outputs. Results on synthetic
and experimental data show that the so-called NSED regression
“add-on” improves the accuracy
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Keywords/Subjects: Euclidean distance (ED) fitting noise extraction (NE) orthogonal distance parameter estimation parameter extraction |
Knowledge area: CDU: Ciencias aplicadas: Ingeniería. Tecnología |
Type of document: info:eu-repo/semantics/article |
Access rights: info:eu-repo/semantics/openAccess |
DOI: https://doi.org/ 10.1109/JPHOTOV.2022.3159390 |
Published in: IEEE Journal of Photovoltaics, vol. 12, no. 3, may 2022 |
Appears in Collections: Artículos Ingeniería de computadores
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