Please use this identifier to cite or link to this item:
https://hdl.handle.net/11000/38867
On measures of dissimilarity between point patterns: Classification based on prototypes and multidimensional scaling
View/Open: 2015 Mateu et al On measures of dissimilarity between point patterns - Biometrical_Journal.pdf
1,16 MB
Adobe PDF
Share:
This resource is restricted
Title: On measures of dissimilarity between point patterns: Classification based on prototypes and multidimensional scaling |
Authors: Mateu, Jorge Schoenberg, Frederic Paik Diez, David M. González Monsalve, Jonatan Andrey Lu, Weipeng |
Editor: Wiley |
Department: Departamentos de la UMH::Estadística, Matemáticas e Informática |
Issue Date: 2015 |
URI: https://hdl.handle.net/11000/38867 |
Abstract:
This paper presents a collection of dissimilarity measures to describe and then classify spatial point patterns when multiple replicates of different types are available for analysis. In particular, we consider a range of distances including the spike-time distance and its variants, as well as cluster-based distances and dissimilarity measures based on classical statistical summaries of point patterns. We review and explore, in the form of a tutorial, their uses, and their pros and cons. These distances are then used to summarize and describe collections of repeated realizations of point patterns via prototypes and multidimensional scaling. We also show a simulation study to evaluate the performance of multidimensional scaling with two types of selected distances. Finally, a multivariate spatial point pattern of a natural plant community is analyzed through various of these measures of dissimilarity.
|
Keywords/Subjects: classification K-function multidimensional scaling point patterns prototypes spike-time distance |
Knowledge area: CDU: Ciencias puras y naturales: Matemáticas |
Type of document: info:eu-repo/semantics/article |
Access rights: info:eu-repo/semantics/closedAccess Attribution-NonCommercial-NoDerivatives 4.0 Internacional |
DOI: https://doi.org/10.1002/bimj.201300150 |
Published in: Biometrical Journal |
Appears in Collections: Artículos - Estadística, Matemáticas e Informática
|
???jsp.display-item.text9???