Please use this identifier to cite or link to this item: https://hdl.handle.net/11000/30645

SiC MOSFET vs SiC/Si Cascode short circuit robustness benchmark

Title:
SiC MOSFET vs SiC/Si Cascode short circuit robustness benchmark
Authors:
Marroquí, David  
Garrigós, Ausias  
Blanes, Jose M.  
Gutiérrez Mazón, roberto  
Maset, Enrique  
Iannuzzo, Francesco  
Editor:
Elsevier
Department:
Departamentos de la UMH::Ingeniería de Comunicaciones
Issue Date:
2019-07-12
URI:
https://hdl.handle.net/11000/30645
Abstract:
Nowadays, MOSFET SiC semiconductors short circuit capability is a key issue. SiC/Si Cascodes are compound semiconductors that, in some aspects, show a similar MOSFET behaviour. No interlayer dielectric insulation suggests, in theory, Cascode JFETs as more robust devices. The purpose of this paper i...  Ver más
Knowledge area:
CDU: Ciencias aplicadas: Ingeniería. Tecnología
Type of document:
info:eu-repo/semantics/article
Access rights:
info:eu-repo/semantics/openAccess
Attribution-NonCommercial-NoDerivatives 4.0 Internacional
DOI:
https://doi.org/10.1016/j.microrel.2019.113429
Appears in Collections:
Artículos Ingeniería Comunicaciones



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