Título : Low-Cost Direct-Writing of Silver-Based Ink for Planar Microwave Circuits up to 10 GHz |
Autor : Blanco-Angulo, Carolina Martínez-Lozano, Andrea Arias-Rodríguez, Julia Rodríguez-Martínez, Alberto Vicente-Samper, José María Sabater-Navarro, José María Ávila-Navarro, Ernesto |
Editor : IEEE |
Departamento: Departamentos de la UMH::Ciencia de Materiales, Óptica y Tecnología Electrónica |
Fecha de publicación: 2023-01 |
URI : https://hdl.handle.net/11000/38447 |
Resumen :
Direct ink writing (DIW) of conductive ink is a printed electronics technology that allows
a variety of electronic circuits to be produced in a simple way and with minimal waste of materials.
In recent years it has been used for rapid prototyping of RF circuits typically working at S-band frequencies
(2 4 GHz). In an attempt to extend this frequency range while maintaining cost-effective prototyping, this
work has focused on proving the feasibility of DIW of silver-conductive (SC) ink for the fabrication of
planar microwave circuits beyond 10 GHz, more speci cally, ultra-wideband (UWB) antennas for medical
applications. For this purpose, the DC and RF performance of the SC ink, as well as the FR4 substrate
used, were rst evaluated. Based on the comparison between experimental and simulated results, we have
found that the effective RF conductivity of the SC ink is approximately 27.6% of its DC value and 3.4% of
the copper conductivity. A few test microstrip circuits were fabricated by DIW, namely two S-band lters
and one UWB antenna. The overall measured performance of all of them agreed well with simulations.
In particular, the DIW antenna exhibited a bandwidth of 8.2 GHz (between 2.4 and 10.6 GHz), and was
compared with an identical copper antenna showing that both have very similar characteristics. It was also
found that the lower conductivity of SC ink as compared to copper led to a gain reduction of only 0.3 dB.
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Palabras clave/Materias: direct-ink-writing silver-conductive ink additive manufacturing printed electronics ultrawideband antennas electrical conductivity conductor losses ultrasonic non-destructive testing |
Área de conocimiento : CDU: Ciencias aplicadas: Ingeniería. Tecnología |
Tipo de documento : info:eu-repo/semantics/article |
Derechos de acceso: info:eu-repo/semantics/openAccess Attribution-NonCommercial-NoDerivatives 4.0 Internacional |
DOI : https://doi.org/10.1109/ACCESS.2023.3234772 |
Publicado en: IEEE Access, 2023 |
Aparece en las colecciones: Artículos - Ciencia de los materiales, óptica y tecnología electrónica
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