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https://hdl.handle.net/11000/34239
Relationships between remarkable points in photovoltaic I–V curves
Título : Relationships between remarkable points in photovoltaic I–V curves |
Autor : Moreno-Vassart, Xavier  Toledo Melero, Fco. Javier  Herranz Cuadrado, Maria Victoria  Galiano, Vicente  |
Editor : Elsevier |
Departamento: Departamentos de la UMH::Estadística, Matemáticas e Informática |
Fecha de publicación: 2024 |
URI : https://hdl.handle.net/11000/34239 |
Resumen :
In this work we reveal certain intrinsic relationships between the remarkable points of an I–V curve of
a photovoltaic panel. Specifically, we carry out a thorough statistical study to determine the existing
interconnections between the open-circuit and short-circuit points with the maximum power point, which
constitute the so-called remarkable points of an I–V curve. To accomplish this, we analyse nearly one million
I–V curves from the National Renewable Energy Laboratory database of the US. Although we find out clear
generic relationships, we also provide concrete expressions that connect the remarkable points with a high level
of confidence for each of the technologies analysed, which implies that the open-circuit and the short-circuit
points can be estimated only with information from the solar panel operating in real time near the maximum
power point. Specifically, we provide the regression coefficients of the linear relationships, as well as empirical
bounds covering 95% of the samples for the distributions of the ratios between the remarkable points. The
results indicate the high reliability of the given estimates.
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Palabras clave/Materias: Single-diode model Remarkable points Key points Maximum power Open-circuit point Short-circuit point |
Área de conocimiento : CDU: Ciencias puras y naturales: Matemáticas |
Tipo de documento : info:eu-repo/semantics/article |
Derechos de acceso: info:eu-repo/semantics/openAccess Attribution-NonCommercial-NoDerivatives 4.0 Internacional |
DOI : https://doi.org/10.1016/j.renene.2024.121661 |
Aparece en las colecciones: Artículos Estadística, Matemáticas e Informática
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La licencia se describe como: Atribución-NonComercial-NoDerivada 4.0 Internacional.