Please use this identifier to cite or link to this item: https://hdl.handle.net/11000/37993

LVDC SiC MOSFET Analog Electronic Fuse With Self-Adjusting Tripping Time Depending on Overcurrent Condition

Title:
LVDC SiC MOSFET Analog Electronic Fuse With Self-Adjusting Tripping Time Depending on Overcurrent Condition
Authors:
Marroquí, David
Garrigós, Ausiàs
Blanes, José Manuel
Editor:
Institute of Electrical and Electronics Engineers (IEEE)
Department:
Departamentos de la UMH::Ciencia de Materiales, Óptica y Tecnología Electrónica
Issue Date:
2022
URI:
https://hdl.handle.net/11000/37993
Abstract:
This article deals with the design of an electronic fuse for 380 V dc distribution systems. It has been devised for applications that require current limitation up to 3 A, so approximately 1.2 kW. To protect the main semiconductor against excessive energy dissipation, the tripping time, defined as the time that circuit operates in current-limitation mode, varies with the current fault magnitude, and eventually for very hard fault conditions, i.e., short-circuit, the circuit acts as a circuit-breaker avoiding current-limitation operation. Furthermore, thermal foldback characteristic, defined as the variation of current limitation setpoint with temperature, and tripping time variation with temperature are also considered. Mathematical analysis, circuit design, simulations, and experimental validation have been carried out using a SiC MOSFET as power semiconductor. Experimental results working under different conditions show an excellent performance.
Keywords/Subjects:
circuit faults
MOSFET
fuses
resistors
circuit breakers
sensors
silicon carbide
Knowledge area:
CDU: Ciencias aplicadas: Ingeniería. Tecnología
CDU: Ciencias aplicadas: Ingeniería. Tecnología: Ingeniería mecánica en general. Tecnología nuclear. Electrotecnia. Maquinaria: Ingeniería eléctrica. Electrotecnia. Telecomunicaciones
Type of document:
info:eu-repo/semantics/article
Access rights:
info:eu-repo/semantics/openAccess
Attribution-NonCommercial-NoDerivatives 4.0 Internacional
DOI:
https://doi.org/10.1109/TIE.2021.3104606
Published in:
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS
Appears in Collections:
Artículos - Ciencia de los materiales, óptica y tecnología electrónica



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