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LVDC SiC MOSFET Analog Electronic Fuse With Self-Adjusting Tripping Time Depending on Overcurrent Condition

Título :
LVDC SiC MOSFET Analog Electronic Fuse With Self-Adjusting Tripping Time Depending on Overcurrent Condition
Autor :
Marroquí, David
Garrigós, Ausiàs
Blanes, José Manuel
Editor :
Institute of Electrical and Electronics Engineers (IEEE)
Departamento:
Departamentos de la UMH::Ciencia de Materiales, Óptica y Tecnología Electrónica
Fecha de publicación:
2022
URI :
https://hdl.handle.net/11000/37993
Resumen :
This article deals with the design of an electronic fuse for 380 V dc distribution systems. It has been devised for applications that require current limitation up to 3 A, so approximately 1.2 kW. To protect the main semiconductor against excessive energy dissipation, the tripping time, defined as the time that circuit operates in current-limitation mode, varies with the current fault magnitude, and eventually for very hard fault conditions, i.e., short-circuit, the circuit acts as a circuit-breaker avoiding current-limitation operation. Furthermore, thermal foldback characteristic, defined as the variation of current limitation setpoint with temperature, and tripping time variation with temperature are also considered. Mathematical analysis, circuit design, simulations, and experimental validation have been carried out using a SiC MOSFET as power semiconductor. Experimental results working under different conditions show an excellent performance.
Palabras clave/Materias:
circuit faults
MOSFET
fuses
resistors
circuit breakers
sensors
silicon carbide
Área de conocimiento :
CDU: Ciencias aplicadas: Ingeniería. Tecnología
CDU: Ciencias aplicadas: Ingeniería. Tecnología: Ingeniería mecánica en general. Tecnología nuclear. Electrotecnia. Maquinaria: Ingeniería eléctrica. Electrotecnia. Telecomunicaciones
Tipo de documento :
info:eu-repo/semantics/article
Derechos de acceso:
info:eu-repo/semantics/openAccess
Attribution-NonCommercial-NoDerivatives 4.0 Internacional
DOI :
https://doi.org/10.1109/TIE.2021.3104606
Publicado en:
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS
Aparece en las colecciones:
Artículos - Ciencia de los materiales, óptica y tecnología electrónica



Creative Commons La licencia se describe como: Atribución-NonComercial-NoDerivada 4.0 Internacional.