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dc.contributor.authorMelgarejo Lermas, Juan Carlos-
dc.contributor.authorSan-Blas, Angel-Antonio-
dc.contributor.authorOssorio García, Javier-
dc.contributor.authorGuglielmi, Marco-
dc.contributor.authorBoria, Vicente-
dc.contributor.otherDepartamentos de la UMH::Ingeniería de Comunicacioneses_ES
dc.date.accessioned2023-11-15T08:00:46Z-
dc.date.available2023-11-15T08:00:46Z-
dc.date.created2021-10-
dc.identifier.citationInternational Journal of Microwave and Wireless Technologies, Volume 14 Special Issue 3es_ES
dc.identifier.issn1759-0795-
dc.identifier.issn1759-0787-
dc.identifier.urihttps://hdl.handle.net/11000/30158-
dc.description.abstractA common strategy to reduce the cost of a filter is to use a manufacturing technique with an intermediate accuracy and use tuning elements to compensate for the manufacturing errors. However, including tuning elements in the final EM simulations, and tuning the filters after manufacturing, can be quite challenging. In this context, therefore, we review in this paper two powerful filter design procedures based on Aggressive Space Mapping (ASM), and two semi-automatic tuning techniques. As a validation, we describe in detail the design and tuning of two types of filters that are commonly used for both space and ground applications, namely, a six-pole inductive filter in rectangular waveguide, and a more complex five-pole filter based on dual-mode resonatorses_ES
dc.formatapplication/pdfes_ES
dc.format.extent10es_ES
dc.language.isoenges_ES
dc.rightsinfo:eu-repo/semantics/openAccesses_ES
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/*
dc.subjectAggressive Spacees_ES
dc.subjectdesignes_ES
dc.subjecttuninges_ES
dc.subjectwaveguide filterses_ES
dc.subject.otherCDU::6 - Ciencias aplicadas::62 - Ingeniería. Tecnología::621 - Ingeniería mecánica en general. Tecnología nuclear. Electrotecnia. Maquinaria::621.3 - Ingeniería eléctrica. Electrotecnia. Telecomunicacioneses_ES
dc.titleSpace mapping filter design and tuning techniqueses_ES
dc.typeinfo:eu-repo/semantics/articlees_ES
dc.relation.publisherversionhttps://doi.org/10.1017/S175907872100146Xes_ES
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