Please use this identifier to cite or link to this item: https://hdl.handle.net/11000/38867

On measures of dissimilarity between point patterns: Classification based on prototypes and multidimensional scaling


no-thumbnailView/Open:

 2015 Mateu et al On measures of dissimilarity between point patterns - Biometrical_Journal.pdf



1,16 MB
Adobe PDF
Share:

This resource is restricted

Title:
On measures of dissimilarity between point patterns: Classification based on prototypes and multidimensional scaling
Authors:
Mateu, Jorge
Schoenberg, Frederic Paik
Diez, David M.
González Monsalve, Jonatan Andrey
Lu, Weipeng
Editor:
Wiley
Department:
Departamentos de la UMH::Estadística, Matemáticas e Informática
Issue Date:
2015
URI:
https://hdl.handle.net/11000/38867
Abstract:
This paper presents a collection of dissimilarity measures to describe and then classify spatial point patterns when multiple replicates of different types are available for analysis. In particular, we consider a range of distances including the spike-time distance and its variants, as well as cluster-based distances and dissimilarity measures based on classical statistical summaries of point patterns. We review and explore, in the form of a tutorial, their uses, and their pros and cons. These distances are then used to summarize and describe collections of repeated realizations of point patterns via prototypes and multidimensional scaling. We also show a simulation study to evaluate the performance of multidimensional scaling with two types of selected distances. Finally, a multivariate spatial point pattern of a natural plant community is analyzed through various of these measures of dissimilarity.
Keywords/Subjects:
classification
K-function
multidimensional scaling
point patterns
prototypes
spike-time distance
Knowledge area:
CDU: Ciencias puras y naturales: Matemáticas
Type of document:
info:eu-repo/semantics/article
Access rights:
info:eu-repo/semantics/closedAccess
Attribution-NonCommercial-NoDerivatives 4.0 Internacional
DOI:
https://doi.org/10.1002/bimj.201300150
Published in:
Biometrical Journal
Appears in Collections:
Artículos - Estadística, Matemáticas e Informática



Creative Commons ???jsp.display-item.text9???