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dc.contributor.authorMarroquí, David-
dc.contributor.authorGarrigós, Ausiàs-
dc.contributor.authorBlanes, José Manuel-
dc.contributor.otherDepartamentos de la UMH::Ciencia de Materiales, Óptica y Tecnología Electrónicaes_ES
dc.date.accessioned2025-11-10T10:32:49Z-
dc.date.available2025-11-10T10:32:49Z-
dc.date.created2022-
dc.identifier.citationIEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICSes_ES
dc.identifier.issn1557-9948-
dc.identifier.issn0278-0046-
dc.identifier.urihttps://hdl.handle.net/11000/37993-
dc.description.abstractThis article deals with the design of an electronic fuse for 380 V dc distribution systems. It has been devised for applications that require current limitation up to 3 A, so approximately 1.2 kW. To protect the main semiconductor against excessive energy dissipation, the tripping time, defined as the time that circuit operates in current-limitation mode, varies with the current fault magnitude, and eventually for very hard fault conditions, i.e., short-circuit, the circuit acts as a circuit-breaker avoiding current-limitation operation. Furthermore, thermal foldback characteristic, defined as the variation of current limitation setpoint with temperature, and tripping time variation with temperature are also considered. Mathematical analysis, circuit design, simulations, and experimental validation have been carried out using a SiC MOSFET as power semiconductor. Experimental results working under different conditions show an excellent performance.es_ES
dc.formatapplication/pdfes_ES
dc.format.extent9es_ES
dc.language.isoenges_ES
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)es_ES
dc.relation.ispartofseriesVol. 69es_ES
dc.relation.ispartofseriesnº 8es_ES
dc.rightsinfo:eu-repo/semantics/openAccesses_ES
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 Internacional*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/*
dc.subjectcircuit faultses_ES
dc.subjectMOSFETes_ES
dc.subjectfuseses_ES
dc.subjectresistorses_ES
dc.subjectcircuit breakerses_ES
dc.subjectsensorses_ES
dc.subjectsilicon carbidees_ES
dc.subject.otherCDU::6 - Ciencias aplicadas::62 - Ingeniería. Tecnologíaes_ES
dc.subject.otherCDU::6 - Ciencias aplicadas::62 - Ingeniería. Tecnología::621 - Ingeniería mecánica en general. Tecnología nuclear. Electrotecnia. Maquinaria::621.3 - Ingeniería eléctrica. Electrotecnia. Telecomunicacioneses_ES
dc.titleLVDC SiC MOSFET Analog Electronic Fuse With Self-Adjusting Tripping Time Depending on Overcurrent Conditiones_ES
dc.typeinfo:eu-repo/semantics/articlees_ES
dc.relation.publisherversionhttps://doi.org/10.1109/TIE.2021.3104606es_ES
Aparece en las colecciones:
Artículos - Ciencia de los materiales, óptica y tecnología electrónica


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