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https://hdl.handle.net/11000/31238
Measuring the spatial deformation of a liquid-crystal on silicon display with a self-interference effect
Título : Measuring the spatial deformation of a liquid-crystal on silicon display with a self-interference effect |
Autor : Marco, David Vargas, Asticio Sánchez López, María del Mar Moreno Soriano, Ignacio |
Editor : Optica Publishing Group |
Departamento: Departamentos de la UMH::Física Aplicada |
Fecha de publicación: 2020-08-15 |
URI : https://hdl.handle.net/11000/31238 |
Resumen :
We present a simple technique to characterize the spatial
non-uniformity of a liquid-crystal on silicon (LCOS)
spatial light modulator (SLM). It is based on illuminating
the display with a wavelength out of the operation range,
so there is a significant reflection at the output surface. As
a consequence, a Gires–Tournois interferometer is directly
created, without any alignment requirement and insensitive
to vibrations. The beam reflected at the output surface is
the reference beam, while the beam reflected at the silicon
backplane is modulated with the addressed gray level in
order to quantitatively derive its deformation.We provide an
experimental demonstration using a LCOS-SLM designed
to operate in the near-infrared range but illuminated with
visible light.
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Área de conocimiento : CDU: Ciencias puras y naturales: Física: Óptica |
Tipo de documento : info:eu-repo/semantics/article |
Derechos de acceso: info:eu-repo/semantics/OpenAccess Attribution-NonCommercial-NoDerivatives 4.0 Internacional |
DOI : https://doi.org/10.1364/OL.396105 |
Aparece en las colecciones: Instituto de Bioingeniería
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La licencia se describe como: Atribución-NonComercial-NoDerivada 4.0 Internacional.