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2015 Mateu et al On measures of dissimilarity between point patterns - Biometrical_Journal.pdf.jpg2015On measures of dissimilarity between point patterns: Classification based on prototypes and multidimensional scaling
Mateu, Jorge; Schoenberg, Frederic Paik; Diez, David M.; González Monsalve, Jonatan Andrey; Lu, Weipeng
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